Thick Aluminum Nitride Substrate for RTP Furnace's Sample Holder - EQ-AIN-Holder

Thick Aluminum Nitride Substrate for RTP Furnace's Sample Holder - EQ-AIN-HolderSuch unpolished Aluminum Nitride can be placed in the center of holder for holding test samples up to 3" or 5" diam. The excellent temperature uniformity can be achieved in this 3" or 5" diam. area due to the benefit from its high thermal conductivity. Aluminum Nitride Ceramic Substrates Properties Item No. AIN Holder Purity (wt%) 99% (AN5116) Density (g cm3) >3. 26 Thermal Conductivity (W m. K) >170 Thermal Expansion (x10 6 oC) <4. 2 Dielectric

410 MPa (9 um)

The testing software (TC5

they are generally not used in dynamic applications

Other Sapphire

5 +/- 1 mm)

Current Input = 100 mA max Input Impedance 100 Meg ohms for 100 mV or ±50 mV input range

2 mL) volume range in stock

To use the ball mill in the glovebox with Ar gas

If the power failure occurs during testing

3                        Pic

For cutting sticky materials such as non-ferrous alloy

powder screened to 200 MESH Melting point / Melting range 900 - 975° C  SDS XRD File Package 50 grams units in a glass container